Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6064717 | Unrestricted motion apparatus and method for x-ray diffraction analysis | Delrose Winter | 2000-05-16 |
| 5359640 | X-ray micro diffractometer sample positioner | Juergen Fink, Rolf Schipper, Kingsley L. Smith | 1994-10-25 |
| 4472883 | Structural movement measuring device | — | 1984-09-25 |