Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6163592 | Beam scattering measurement system with transmitted beam energy detection | Bob Baoping He | 2000-12-19 |
| 5359640 | X-ray micro diffractometer sample positioner | Juergen Fink, Rolf Schipper, Richard Ortega | 1994-10-25 |