Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8867704 | Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source | Joachim Lange | 2014-10-21 |
| 7746980 | X-ray reflectometry system with multiple sample holder and individual sample lifting mechanism | Eduard Konusch, Rachel Eisenhower, Lutz Bruegemann | 2010-06-29 |
| 7295650 | Method for operating a primary beam stop | Joachim Lange | 2007-11-13 |
| 6956928 | Vertical small angle x-ray scattering system | Bob Baoping He | 2005-10-18 |
| 6111930 | Automatic sample changer for an X-ray diffractometer | — | 2000-08-29 |
| 5359640 | X-ray micro diffractometer sample positioner | Juergen Fink, Kingsley L. Smith, Richard Ortega | 1994-10-25 |