Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345660 | Method for evaluating crystal defects in silicon carbide single crystal wafer | Toru Takahashi, Hisao Muraki | 2025-07-01 |
| 8729676 | Silicon epitaxial wafer and method for manufacturing the same | Hiroshi Takeno | 2014-05-20 |