Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345660 | Method for evaluating crystal defects in silicon carbide single crystal wafer | Yutaka Shiga, Toru Takahashi | 2025-07-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345660 | Method for evaluating crystal defects in silicon carbide single crystal wafer | Yutaka Shiga, Toru Takahashi | 2025-07-01 |