Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5899744 | Method of manufacturing semiconductor wafers | Kohei Toyama, Shoichi Takamizawa | 1999-05-04 |
| 5684599 | Wafer notch dimension measuring apparatus | Shigetoshi Shimoyama | 1997-11-04 |