Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12372863 | Photomask blank, method for producing photomask, and photomask | Naoki Matsuhashi | 2025-07-29 |
| 11940391 | Defect inspection apparatus, method for inspecting defect, and method for manufacturing photomask blank | Takumi Yoshino, Tsuneo Terasawa | 2024-03-26 |