Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10620235 | Cantilever attachment fitting and scanning probe microscope provided therewith | — | 2020-04-14 |
| 6532805 | Micro-material testing apparatus | Naoya Tada | 2003-03-18 |
| 6137115 | Film inspecting apparatus | Yasuhiro Yamakage, Makoto Shinohara | 2000-10-24 |
| 5200616 | Environment controllable scanning probe microscope | Osamu Nishikawa, Masahiko Tomitori | 1993-04-06 |