JM

Jer-Shen Maa

SA Sharp Laboratories Of America: 93 patents #6 of 419Top 2%
Sharp Kabushiki Kaisha: 10 patents #1,673 of 10,731Top 20%
RC Rca: 5 patents #240 of 1,739Top 15%
ST Sharp Microelectronics Technology: 3 patents #8 of 57Top 15%
GE: 1 patents #19,878 of 36,430Top 55%
📍 Manville, NJ: #1 of 39 inventorsTop 3%
🗺 New Jersey: #211 of 69,400 inventorsTop 1%
Overall (All Time): #14,043 of 4,157,543Top 1%
102
Patents All Time

Issued Patents All Time

Showing 76–100 of 102 patents

Patent #TitleCo-InventorsDate
6479304 Iridium composite barrier structure and method for same Fengyan Zhang, Sheng Teng Hsu 2002-11-12
6468901 Nickel silicide including iridium for use in ultra-shallow junctions with high thermal stability and method of manufacturing the same Yoshi Ono, Fengyan Zhang 2002-10-22
6462366 Ferroelectric nonvolatile transistor Sheng Teng Hsu, Fengyan Zhang, Tingkai Li 2002-10-08
6441417 Single c-axis PGO thin film on ZrO2 for non-volatile memory applications and methods of making the same Fengyan Zhang, Yanjun Ma, Wei-Wei Zhuang, Sheng Teng Hsu 2002-08-27
6372034 PGO solutions for the preparation of PGO thin films via spin coating Wei-Wei Zhuang, Fengyan Zhang, Sheng Teng Hsu 2002-04-16
6368960 Double sidewall raised silicided source/drain CMOS transistor Sheng Teng Hsu 2002-04-09
6350699 Method for anisotropic plasma etching using non-chlorofluorocarbon, fluorine-based chemistry Fengyan Zhang 2002-02-26
6339245 Nitride overhang structure for the silicidation of transistor electrodes with shallow junctions Sheng Teng Hsu, Chien-Hsiung Peng 2002-01-15
6303502 MOCVD metal oxide for one transistor memory Sheng Teng Hsu, David R. Evans, Tingkai Li, Wei-Wei Zhuang 2001-10-16
6288420 Composite iridium-metal-oxygen barrier structure with refractory metal companion barrier Fengyan Zhang, Sheng Teng Hsu, Wei-Wei Zhuang 2001-09-11
6236113 Iridium composite barrier structure and method for same Fengyan Zhang, Sheng Teng Hsu 2001-05-22
6218249 MOS transistor having shallow source/drain junctions and low leakage current Sheng Teng Hsu, Chien-Hsiung Peng 2001-04-17
6190963 Composite iridium-metal-oxygen barrier structure with refractory metal companion barrier and method for same Fengyan Zhang, Sheng Teng Hsu, Wei-Wei Zhuang 2001-02-20
6071782 Partial silicidation method to form shallow source/drain junctions Sheng Teng Hsu, Chien-Hsiung Peng 2000-06-06
6048740 Ferroelectric nonvolatile transistor and method of making same Sheng Teng Hsu, Fengyang Zhang, Tingkai Li 2000-04-11
6043164 Method for transferring a multi-level photoresist pattern Tue Nguyen, Sheng Teng Hsu, Bruce D. Ulrich, Chien-Hsiung Peng 2000-03-28
5989965 Nitride overhang structures for the silicidation of transistor electrodes with shallow junction Sheng Teng Hsu, Chien-Hsiung Peng 1999-11-23
5950078 Rapid thermal annealing with absorptive layers for thin film transistors on transparent substrates Masashi Maekawa 1999-09-07
5918150 Method for a chemical vapor deposition of copper on an ion prepared conductive surface Tue Nguyen 1999-06-29
5830775 Raised silicided source/drain electrode formation with reduced substrate silicon consumption Shen Teng Hsu 1998-11-03
5814537 Method of forming transistor electrodes from directionally deposited silicide Sheng Teng Hsu 1998-09-29
4990995 Low reflectance conductor in an integrated circuit 1991-02-05
4648939 Formation of submicrometer lines Sheng-Mou Huang 1987-03-10
4585515 Formation of conductive lines 1986-04-29
4547261 Anisotropic etching of aluminum Bernard Halon 1985-10-15