Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11121045 | Method for detecting ultra-small defect on wafer surface | Gaoyu Wang, Guangzhi He, Xiaofang Gu, Qiliang Ni | 2021-09-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11121045 | Method for detecting ultra-small defect on wafer surface | Gaoyu Wang, Guangzhi He, Xiaofang Gu, Qiliang Ni | 2021-09-14 |