Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11121045 | Method for detecting ultra-small defect on wafer surface | Xianghua Hu, Guangzhi He, Xiaofang Gu, Qiliang Ni | 2021-09-14 |
| 11052316 | Method and apparatus for generating image parameter for reproducible virtual character | Maohua Zhou, Hong Zhu, Lei Xiong, Di Pan, Chan-Cheng Liu | 2021-07-06 |