Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12307651 | Method of detecting measurement error of SEM equipment and method of aligning SEM equipment | Donyun Kim, Yunhyoung Nam, Mincheol KANG, Kihyun Kim | 2025-05-20 |
| 12205267 | Pattern inspection method using pattern model | Donyun Kim, Kihyun Kim, Yunhyoung Nam | 2025-01-21 |