Issued Patents All Time
Showing 51–62 of 62 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7541719 | Stage and X-Y stage each on which to place sample, and charged-particle beam apparatus | Shuichi Nakagawa | 2009-06-02 |
| 7528327 | Inspection method and semiconductor device | — | 2009-05-05 |
| 7441690 | Joined structure of different metals and friction welding method thereof | Katsuhiko Shiotsuki | 2008-10-28 |
| 7443717 | Semiconductor device | Yoshiyuki Kurokawa | 2008-10-28 |
| 7375329 | Scanning electron microscope | Hiroki Kawada, Satoru Iwama | 2008-05-20 |
| 7154274 | High-sensitivity measuring instrument and method of using the instrument to measure a characteristic value at a point in time | Yoshio Sunaoka, Shinichi Ohashi, Toshio Morita | 2006-12-26 |
| 6995370 | Scanning electron microscope | Hiroki Kawada, Satoru Iwama | 2006-02-07 |
| 6833199 | Joined structure of different metal materials | Masayuki Narita, Yasuyuki Hama, Kenji Ikeuchi, Makoto Takahashi | 2004-12-21 |
| 6828038 | Joined structure of different metals and friction welding method thereof | Katsuhiko Shiotsuki | 2004-12-07 |
| 6739388 | Air-conditioning system for a vehicle | Nobuya Nakagawa, Toshihisa Kondo, Kazuo Ishii | 2004-05-25 |
| 6523966 | LCD display with multi-color illumination means | Noriyoshi Satoh, Makoto Tamaru, Fumihiro Muramatsu | 2003-02-25 |
| 5412659 | Inter-cellular interference detection by canceling data corruption events reported by mobile stations | Toshitaro Harada | 1995-05-02 |