Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12159979 | Test jig, test device, and test method for secondary battery | Takashi Kajihara | 2024-12-03 |
| 10804197 | Memory die containing stress reducing backside contact via structures and method of making the same | Motoki KAWASAKI, Xun Gu, Kengo Kajiwara, Jixin Yu | 2020-10-13 |
| 9640544 | Integrated circuit with hydrogen absorption structure | Ryo Urakawa, Hiroshi Omi | 2017-05-02 |