Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9164139 | Memory device and memory system including the same | Jun-Hee Shin, Young-man Ahn, Seung Mo Jung, Sang-Jhun Hwang | 2015-10-20 |
| 9128817 | Address transforming circuit and semiconductor memory device including the same | Seok-Il Kim, Sung-Ho Choi | 2015-09-08 |
| 9099166 | Memory module and memory system comprising same | Jun-Hee Shin, Won-Hyung Song, Jong Min Lee | 2015-08-04 |
| 8742780 | Semiconductor devices including design for test capabilities and semiconductor modules and test systems including such devices | Seok-Il Kim, Ho-Suk Lee, Yang-Ki Kim | 2014-06-03 |
| 8576637 | Memory module including memory buffer and memory system having the same | Soon-Deok Jang, Seok-Il Kim, Seung-Jin Seo | 2013-11-05 |
| 8547761 | Memory module and memory system comprising memory module | Seok-Il Kim, Jung-Joon Lee | 2013-10-01 |
| 8462534 | Memory module cutting off DM pad leakage current | Seok-Il Kim, Seung-Jin Seo | 2013-06-11 |
| 8159853 | Memory module cutting off DM pad leakage current | Seok-Il Kim, Seung-Jin Seo | 2012-04-17 |
| 8051343 | Method of testing a memory module and hub of the memory module | Seung-Man Shin, Byung-Se So, Seung-Jin Seo | 2011-11-01 |
| 7965530 | Memory modules and memory systems having the same | Seung-Jin Seo, Kwan-Yong Jin, Jung-Hwan Choi, Jong Hoon Kim, Seok-Il Kim +1 more | 2011-06-21 |
| 7849373 | Method of testing a memory module and hub of the memory module | Seung-Man Shin, Byung-Se So, Seung-Jin Seo | 2010-12-07 |
| 7814379 | Memory module packaging test system | Jung-kuk Lee, Hui-Chong Shin | 2010-10-12 |
| 7606110 | Memory module, memory unit, and hub with non-periodic clock and methods of using the same | Hui-Chong Shin, Seung-Jin Seo, Byung-Se So, Young-man Ahn, Seung-Man Shin +2 more | 2009-10-20 |
| 7519873 | Methods and apparatus for interfacing between test system and memory | Seung-Man Shin, Seung-Jin Seo, Hui-Chong Shin, Jong-Geon Lee, Kyung-Hee Han | 2009-04-14 |
| 7487413 | Memory module testing apparatus and method of testing memory modules | Jung-kuk Lee, Seung-Jin Seo, Seung-Man Shin, Young-man Ahn | 2009-02-03 |
| 7447954 | Method of testing a memory module and hub of the memory module | Seung-Man Shin, Byung-Se So, Seung-Jin Seo | 2008-11-04 |
| 7426149 | Semiconductor memory module and semiconductor memory device | Seok-Il Kim, Hoe-Ju Chung, Young-man Ahn | 2008-09-16 |