SS

Seung-Man Shin

Samsung: 11 patents #12,136 of 75,807Top 20%
HW Hyundai Wia: 2 patents #33 of 92Top 40%
Overall (All Time): #382,559 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
9298612 Semiconductor memory device and computer system including the same Hyun-Sung Shin, Sang-Joon Hwang, In-Su Choi, Jung-Ho Jung 2016-03-29
8976615 Semiconductor memory device capable of performing refresh operation without auto refresh command Hyun-Sung Shin, In-Su Choi 2015-03-10
8298092 Tripod type constant velocity joint Jeong-Hyun Cho, Dae Hwan Kim, In Sang Lee, Joung Sik Park, Sung Baek An +1 more 2012-10-30
8051343 Method of testing a memory module and hub of the memory module Byung-Se So, Seung-Jin Seo, You-Keun Han 2011-11-01
7874924 Tripod type constant velocity joint Jeong-Hyun Cho, Dae Hwan Kim, In Sang Lee, Joung Sik Park, Sung Baek An +1 more 2011-01-25
7849373 Method of testing a memory module and hub of the memory module Byung-Se So, Seung-Jin Seo, You-Keun Han 2010-12-07
7606110 Memory module, memory unit, and hub with non-periodic clock and methods of using the same You-Keun Han, Hui-Chong Shin, Seung-Jin Seo, Byung-Se So, Young-man Ahn +2 more 2009-10-20
7539910 Memory module test system for memory module including hub Young-man Ahn, Byung-Se So, Seung-Jin Seo 2009-05-26
7519873 Methods and apparatus for interfacing between test system and memory Seung-Jin Seo, You-Keun Han, Hui-Chong Shin, Jong-Geon Lee, Kyung-Hee Han 2009-04-14
7487413 Memory module testing apparatus and method of testing memory modules Jung-kuk Lee, Seung-Jin Seo, You-Keun Han, Young-man Ahn 2009-02-03
7447954 Method of testing a memory module and hub of the memory module Byung-Se So, Seung-Jin Seo, You-Keun Han 2008-11-04
7343533 Hub for testing memory and methods thereof Kee-hoon Lee 2008-03-11
7233157 Test board for high-frequency system level test Jung-kuk Lee, Young-man Ahn, Jong-Cheol Seo 2007-06-19