Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11397380 | Critical dimension measurement system and method of measuring critical dimensions using same | Won Joo Park, Hyung Joo Lee, Seuk Hwan Choi, Dong-Seok Nam | 2022-07-26 |
| 10831095 | Critical dimension measurement system and method of measuring critical dimensions using same | Won Joo Park, Hyung Joo Lee, Seuk Hwan Choi, Dong-Seok Nam | 2020-11-10 |