Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10474133 | Inspection device for inspecting wafer and method of inspecting wafer using the same | Janghee Lee, Sangbong Park, Byeonghwan Jeon | 2019-11-12 |
| 10115640 | Method of manufacturing integrated circuit device | Hee-don Hwang, Young-Wook Park, Min Woo KIM | 2018-10-30 |