Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10622265 | Method of detecting failure of a semiconductor device | Ji Young Choi, Zhan Zhan, Min Seob KIM, Ju Hyun Kim, Hwa-Sung Rhee | 2020-04-14 |
| 10600702 | Test element group and semiconductor wafer including the same | Zhan Zhan, Ju Hyun Kim, Hwa-Sung Rhee | 2020-03-24 |
| 7846790 | Method of fabricating semiconductor device having multiple gate dielectric layers and semiconductor device fabricated thereby | Kang-soo Chu | 2010-12-07 |
| 7795110 | Trench isolation type semiconductor device which prevents a recess from being formed in a field region and method of fabricating the same | Ki-seog Youn, Jong-Hyon Ahn, Deok-Hyung Lee, Kong-Soo Cheong | 2010-09-14 |
| 7732280 | Semiconductor device having offset spacer and method of forming the same | — | 2010-06-08 |
| 7553606 | Methods of forming patterns in semiconductor devices using photo resist patterns | Jin-mo Kang, Jae Ho Lee, Jun Seop Lee | 2009-06-30 |
| 7485558 | Method of manufacturing semiconductor device | Kong-Soo Cheong, Jeong-Ho Shin, Ki Young Kim | 2009-02-03 |
| 7358588 | Trench isolation type semiconductor device which prevents a recess from being formed in a field region | Ki-seog Youn, Jong-Hyon Ahn, Deok-Hyung Lee, Kong-Soo Cheong | 2008-04-15 |
| 7288848 | Overlay mark for measuring and correcting alignment errors | Dong Hun Lee, Jong-Hyon Ahn, Do-Yul Yoo | 2007-10-30 |