Issued Patents All Time
Showing 251–273 of 273 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6917160 | Organic electroluminescent display and method of manufacturing the same | Jae-Bon Koo | 2005-07-12 |
| 6875644 | Methods of manufacturing thin film transistors using masks to protect the channel regions from impurities while doping a semiconductor layer to form source/drain regions | Kyung-Jin Yoo, Kyu-hwan Choi | 2005-04-05 |
| 6864130 | Crystallization method of silicon thin film, thin film transistor manufactured using the method, and flat panel display including the thin film transistor | Jae-Bon Koo, Ji-Yong Park | 2005-03-08 |
| 6855960 | Flat panel display with black matrix and method of fabricating thereof | Dong-Chan Shin, Hye-Dong Kim, Chang-Su Kim | 2005-02-15 |
| 6753235 | Method of manufacturing CMOS thin film transistor | Woo-Young So, Kyung-Jin Yoo | 2004-06-22 |
| 6692997 | Thin film transistors with dual layered source/drain electrodes and manufacturing method thereof, and active matrix display device and manufacturing method thereof | Woo-Young So, Kyung-Jin Yoo | 2004-02-17 |
| 6677567 | Scanning probe microscope with improved scan accuracy, scan speed, and optical vision | Jaewan HONG, Joonhyung Kwon | 2004-01-13 |
| 6646308 | Flat panel display device | Woo-Young So, Kyung-Jin Yoo | 2003-11-11 |
| 6590703 | Optical system for scanning microscope | Ian R. Smith | 2003-07-08 |
| 6265718 | Scanning probe microscope with scan correction | Ian R. Smith | 2001-07-24 |
| 6185991 | Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode | Jaewan HONG, Zheong-Gu Khim | 2001-02-13 |
| 6130427 | Scanning probe microscope with multimode head | Frederick I. Linker, Ian R. Smith, Michael D. Kirk, John D. Alexander, Sung Il Park | 2000-10-10 |
| 6057547 | Scanning probe microscope with scan correction | Ian R. Smith | 2000-05-02 |
| 5939719 | Scanning probe microscope with scan correction | Ian R. Smith, Michael D. Kirk | 1999-08-17 |
| 5750069 | Method and apparatus for discriminating vehicle types | Yung Lew, Won-Seo Park, Yong-Sung Park, Young-Ho Kim, In Soo Kim +1 more | 1998-05-12 |
| 5714756 | Scanning probe microscope having a single viewing device for on-axis and oblique angle views | Frederick I. Linker, Ian R. Smith | 1998-02-03 |
| 5672816 | Large stage system for scanning probe microscopes and other instruments | Ian R. Smith, Michael D. Kirk | 1997-09-30 |
| RE35514 | Scanning force microscope having aligning and adjusting means | Thomas R. Albrecht, Moris Dovek, Michael D. Kirk | 1997-05-20 |
| 5496999 | Scanning probe microscope | Frederick I. Linker, Michael D. Kirk, John D. Alexander, Sung Il Park, Ian R. Smith +1 more | 1996-03-05 |
| 5448399 | Optical system for scanning microscope | Frederick I. Linker, Ian R. Smith | 1995-09-05 |
| 5376790 | Scanning probe microscope | Frederick I. Linker, Michael D. Kirk, John D. Alexander, Sung Il Park, Ian R. Smith | 1994-12-27 |
| 5157251 | Scanning force microscope having aligning and adjusting means | Thomas R. Albrecht, Moris Dovek, Michael D. Kirk | 1992-10-20 |
| 4908519 | Loading mechanism and support structure having improved vibration damping useful in scanning tunneling microscopy | Calvin F. Quate | 1990-03-13 |