KK

Kye-hyun Kyung

Samsung: 61 patents #1,274 of 75,807Top 2%
📍 Yongin-si, KR: #236 of 9,683 inventorsTop 3%
Overall (All Time): #38,185 of 4,157,543Top 1%
61
Patents All Time

Issued Patents All Time

Showing 1–25 of 61 patents

Patent #TitleCo-InventorsDate
9817434 Memory system controlling peak current generation for a plurality of memories by synchronizing internal clock of each memory with a processor clock at different times to avoid peak current generation period overlapping Bo-Geun Kim, Jae-Yong Jeong, Seung Hun Choi, Seok-Cheon Kwon, Chul-Ho Lee 2017-11-14
9261940 Memory system controlling peak current generation for a plurality of memories by monitoring a peak signal to synchronize an internal clock of each memory by a processor clock at different times Bo-Geun Kim, Jae-Yong Jeong, Seung Hun Choi, Seok-Cheon Kwon, Chul-Ho Lee 2016-02-16
RE45378 Method for receiving data 2015-02-17
RE45366 Method of writing data to a memory 2015-02-10
8729615 Non-volatile memory device with high speed operation and lower power consumption Chang-Hyun Lee, Young Woo Park, CHEON AN LEE, Sung-Il Chang, Chul Bum Kim 2014-05-20
RE44618 Devices and methods for controlling active termination resistors in a memory system 2013-12-03
8477546 Semiconductor memory devices having redundancy arrays 2013-07-02
RE44064 Semiconductor memory device and module for high frequency operation 2013-03-12
8120976 Line defect detection circuit for detecting weak line Eunsung Seo 2012-02-21
7961018 Semiconductor device including delay locked loop having periodically activated replica path Seok-Hun Hyun, Jun Ho SHIN 2011-06-14
7894260 Synchronous semiconductor memory device having on-die termination circuit and on-die termination method Dong Jin Lee, Chang-sik Yoo 2011-02-22
7804720 Integrated circuit memory devices including mode registers set using a data input/output bus Kee-hoon Lee, Chang-sik Yoo 2010-09-28
7787283 Devices and methods for controlling active termination resistors in a memory system 2010-08-31
7765442 Memory device testable without using data and dataless test method 2010-07-27
7679975 Semiconductor memory devices having redundancy arrays 2010-03-16
7636273 Integrated circuit memory devices that support selective mode register set commands Kee-hoon Lee, Chang-sik Yoo 2009-12-22
7616473 Devices and methods for controlling active termination resistors in a memory system 2009-11-10
7539826 System, device, and method for improved mirror mode operation of a semiconductor memory device Moo Sung Chae 2009-05-26
7477067 Semiconductor integrated circuit which can be burn-in-tested even when packaged and method of burn-in-testing semiconductor integrated circuit even when the semiconductor integrated circuit is packaged 2009-01-13
7457192 Semiconductor memory device and module for high frequency operation 2008-11-25
7457189 Integrated circuit memory devices that support selective mode register set commands and related methods Kee-hoon Lee, Chang-sik Yoo 2008-11-25
7447084 Semiconductor memory device and method of supplying wordline voltage thereof Nak-Won Heo 2008-11-04
7426145 Synchronous semiconductor memory device having on-die termination circuit and on-die termination method Dong Jin Lee, Chang-sik Yoo 2008-09-16
7369445 Methods of operating memory systems including memory devices set to different operating modes and related systems Kee-hoon Lee, Chang-sik Yoo 2008-05-06
7313715 Memory system having stub bus configuration Chang-sik Yoo, Byung-Se So 2007-12-25