Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8976348 | Wafer inspection system | Hwan-seok Jang, Jun-seog Seong, Ho-Bong Shin, Kil-su Lee, Chang-Hun Lee | 2015-03-10 |
| 8711348 | Method of inspecting wafer | Hwan-seok Jang, Jun-seog Seong, Ho-Bong Shin, Kil-su Lee, Chang-Hun Lee | 2014-04-29 |
| 6372556 | Semiconductor device having a fuse and fabricating method therefor | — | 2002-04-16 |
| 5147809 | Method of producing a bipolar transistor with a laterally graded emitter (LGE) employing a refill method of polycrystalline silicon | Tae Young Won, Seog-Heon Han, Moon Ho Kim | 1992-09-15 |