Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8976348 | Wafer inspection system | Hwan-seok Jang, Jang-man Ko, Jun-seog Seong, Kil-su Lee, Chang-Hun Lee | 2015-03-10 |
| 8711348 | Method of inspecting wafer | Hwan-seok Jang, Jang-man Ko, Jun-seog Seong, Kil-su Lee, Chang-Hun Lee | 2014-04-29 |
| 7271080 | Electrically erasable programmable read only memory (EEPROM) cells and methods of fabricating the same | Young-Ho Kim | 2007-09-18 |
| 7019354 | Electrically erasable programmable read only memory (EEPROM) cells and methods of fabricating the same | Young-Ho Kim | 2006-03-28 |