Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8976348 | Wafer inspection system | Jang-man Ko, Jun-seog Seong, Ho-Bong Shin, Kil-su Lee, Chang-Hun Lee | 2015-03-10 |
| 8711348 | Method of inspecting wafer | Jang-man Ko, Jun-seog Seong, Ho-Bong Shin, Kil-su Lee, Chang-Hun Lee | 2014-04-29 |