Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7114108 | Semiconductor test system and method for effectively testing a semiconductor device having many pins | Heon-Deok Park, Sang-Bae An | 2006-09-26 |
| 6753693 | Test apparatuses for semiconductor integrated circuits | Ki-Myung Seo, Do-Hoon Byun | 2004-06-22 |