Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7859287 | Device power supply extension circuit, test system including the same and method of testing semiconductor devices | Seung-Chul Choi | 2010-12-28 |
| 7114108 | Semiconductor test system and method for effectively testing a semiconductor device having many pins | Heon-Deok Park, Jae-Kuk Jeon | 2006-09-26 |
| 5852300 | Device for sensing a flat zone of a wafer for use in a wafer probe tester | — | 1998-12-22 |