Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6943576 | Systems for testing a plurality of circuit devices | Do-Hoon Byun | 2005-09-13 |
| 6753693 | Test apparatuses for semiconductor integrated circuits | Jae-Kuk Jeon, Do-Hoon Byun | 2004-06-22 |