HL

Hyong-yong Lee

Samsung: 9 patents #14,526 of 75,807Top 20%
SS Skyworks Solutions: 6 patents #250 of 948Top 30%
UF US Air Force: 2 patents #3,473 of 16,312Top 25%
📍 Thousand Oaks, CA: #134 of 1,766 inventorsTop 8%
🗺 California: #35,036 of 386,348 inventorsTop 10%
Overall (All Time): #274,822 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
9865491 Devices for methodologies related to wafer carriers Elena Becerra Woodard, Daniel Kwadwo Amponsah Berkoh, David J. Zapp, Steve Canale, Daniel Eduardo Sanchez +1 more 2018-01-09
9576838 Devices for methodologies related to wafer carriers Elena Becerra Woodard, Daniel Kwadwo Amponsah Berkoh, David J. Zapp, Steve Canale, Daniel Eduardo Sanchez +1 more 2017-02-21
9539801 Debonders with a recess and a side wall opening for semiconductor fabrication Steve Canale, David J. Zapp, Daniel Eduardo Sanchez, Hung V. Phan 2017-01-10
9533484 Debonders with a recess and a heater for semiconductor fabrication Steve Canale, David J. Zapp, Daniel Eduardo Sanchez, Hung V. Phan 2017-01-03
9296194 Debonders and related devices and methods for semiconductor fabrication Steve Canale, David J. Zapp, Daniel Eduardo Sanchez, Hung V. Phan 2016-03-29
8758552 Debonders and related devices and methods for semiconductor fabrication Steve Canale, David J. Zapp, Daniel Eduardo Sanchez, Hung V. Phan 2014-06-24
8243540 Semiconductor memory device and test method thereof Chan-sub Jun 2012-08-14
8036052 Semiconductor memory device and test method thereof Chan-sub Jun 2011-10-11
7791960 Semiconductor memory device and control signal generating method thereof Chung-Ki Lee 2010-09-07
7551499 Semiconductor memory device capable of performing low-frequency test operation and method for testing the same 2009-06-23
7525339 Semiconductor memory device testing on/off state of on-die-termination circuit during data read mode, and test method of the state of on-die-termination circuit 2009-04-28
7426153 Clock-independent mode register setting methods and apparatuses 2008-09-16
7030635 Device for measuring supply voltage and method thereof Gwan-pyo Hong 2006-04-18
6396754 Semiconductor memory device which controls sense amplifier for detecting bit line bridge and method of controlling the semiconductor memory device Suk-bae Jun, Choong-Sun Park 2002-05-28
6252441 Synchronous data sampling circuit Sang-Chul Kim 2001-06-26
5594262 Elevated temperature gallium arsenide field effect transistor with aluminum arsenide to aluminum gallium arsenide mole fractioned buffer layer Belinda Johnson, Rocky Reston, Chris Ito, Gerald Trombley, Charles K. Havasy 1997-01-14
5411902 Process for improving gallium arsenide field effect transistor performance using an aluminum arsenide or an aluminum gallium arsenide buffer layer Belinda Johnson, Rocky Reston, Chris Ito, Gerald Trombley, Charles K. Havasy 1995-05-02