HC

Hee-soon Chae

Samsung: 11 patents #12,136 of 75,807Top 20%
Overall (All Time): #466,599 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8139387 Method of erasing a memory device including complementary nonvolatile memory devices Yoon-dong Park, Jo-won Lee, Chung-woo Kim, Eun-hong Lee, Sun-ae Seo +3 more 2012-03-20
7719871 Methods of operating and manufacturing logic device and semiconductor device including complementary nonvolatile memory device, and reading circuit for the same Yoon-dong Park, Jo-won Lee, Chung-woo Kim, Eun-hong Lee, Sun-ae Seo +3 more 2010-05-18
7349262 Methods of programming silicon oxide nitride oxide semiconductor (SONOS) memory devices Youn-seok Jeong, Chung-woo Kim, Ju-Hyung Kim, Jeong-Hee Han, Jae-woong Hyun 2008-03-25
7345898 Complementary nonvolatile memory device Yoon-dong Park, Jo-won Lee, Chung-woo Kim, Eun-hong Lee, Sun-ae Seo +3 more 2008-03-18
7208365 Nonvolatile memory device and method of manufacturing the same Chung-woo Kim, Kwang-youl Seo, Tae-hyun Han, Byung-Chul Kim, Joo Yeon Kim 2007-04-24
7202521 Silicon-oxide-nitride-oxide-silicon (SONOS) memory device and methods of manufacturing and operating the same Moon-kyung Kim, Chung-woo Kim, Jo-won Lee, Eun-hong Lee 2007-04-10
7112842 Nonvolatile memory device and method of manufacturing the same Chung-woo Kim, Kwang-youl Seo, Tae-hyun Han, Byung-Chul Kim, Joo Yeon Kim 2006-09-26
6946346 Method for manufacturing a single electron memory device having quantum dots between gate electrode and single electron storage element Soo Doo Chae, Byong-man Kim, Moon-kyung Kim, Won-il Ryu 2005-09-20
6936884 Nonvolatile silicon/oxide/nitride/silicon/nitride/oxide/silicon memory Soo Doo Chae, Ju-Hyung Kim, Chung-woo Kim, Won-il Ryu 2005-08-30
6670670 Single electron memory device comprising quantum dots between gate electrode and single electron storage element and method for manufacturing the same Soo Doo Chae, Byong-man Kim, Moon-kyung Kim, Won-il Ryu 2003-12-30
6664123 Method for etching metal layer on a scale of nanometers Byong-man Kim, Soo Doo Chae, Won-il Ryu 2003-12-16