Issued Patents All Time
Showing 26–50 of 56 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7248494 | Semiconductor memory device capable of compensating for leakage current | Hyung-Rok Oh, Baek-Hyung Cho | 2007-07-24 |
| 7245543 | Data read circuit for use in a semiconductor memory and a method therefor | Hyung-Rok Oh, Woo-Yeong Cho | 2007-07-17 |
| 7236393 | Phase-change semiconductor memory device and method of programming same | Beak-Hyung Cho | 2007-06-26 |
| 7227776 | Phase change random access memory (PRAM) device | Beak-Hyung Cho, Du-Eung Kim, Byung-Gil Choi | 2007-06-05 |
| 7221611 | Semiconductor memory device for low power consumption | Gong-Heum Han, Joon-Min Park | 2007-05-22 |
| 7110286 | Phase-change memory device and method of writing a phase-change memory device | Byung-Gil Choi, Du-Eung Kim, Beak-Hyung Cho | 2006-09-19 |
| 7075848 | Redundancy circuit in semiconductor memory device having a multiblock structure | Byung-Gil Choi, Du-Eung Kim | 2006-07-11 |
| 7064601 | Reference voltage generating circuit using active resistance device | Du-Eung Kim, Woo-Yeong Cho | 2006-06-20 |
| 6982913 | Data read circuit for use in a semiconductor memory and a memory thereof | Hyung-Rok Oh, Woo-Yeong Cho | 2006-01-03 |
| 6928022 | Write driver circuit in phase change memory device and method for applying write current | Beak-Hyung Cho | 2005-08-09 |
| 6870783 | Mode entrance control circuit and mode entering method in semiconductor memory device | Bo-Tak Lim | 2005-03-22 |
| 6816429 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Sang-Jib Han, Du-Eung Kim, Yun-seung Shin | 2004-11-09 |
| 6781899 | Semiconductor memory device and test method therof | Gong-Heum Han, Hyou-Youn Nam | 2004-08-24 |
| 6714463 | Semiconductor memory device having reduced chip select output time | Gong-Heum Han, Kyeong-Yoon Bae | 2004-03-30 |
| 6657264 | Layout method of latch-up prevention circuit of a semiconductor device | Beak-Hyung Cho | 2003-12-02 |
| 6490223 | Integrated circuit capable of being burn-in tested using an alternating current stress and a testing method using the same | Sang-Jib Han, Du-Eung Kim, Yun-seung Shin | 2002-12-03 |
| 6456547 | Semiconductor memory device with function of repairing stand-by current failure | Hyun-Sun Mo, Du-Eung Kim | 2002-09-24 |
| 6288926 | Static semiconductor memory device and fabricating method thereof | Du-Eung Kim, Byung-Gil Choi, Sang-Jib Han, Soon-Moon Jung, Sung-Bong Kim | 2001-09-11 |
| 6271705 | Data output circuits having enhanced ESD resistance and related methods | Young-Ho Suh, Sang-Jib Han | 2001-08-07 |
| 6256254 | Semiconductor memory device decoder | Sang-Jib Han | 2001-07-03 |
| 6026039 | Parallel test circuit for semiconductor memory | Du-Eung Kim, Yun-seung Shin | 2000-02-15 |
| 5999390 | Input buffer circuit for semiconductor device | Baek-Hyung Cho, Ho-Geun Shin | 1999-12-07 |
| 5994943 | Data output circuits having enhanced ESD resistance and related methods | Young-Ho Suh, Sang-Jib Han | 1999-11-30 |
| 5959907 | Semiconductor memory device having a redundancy circuit | Du-Eung Kim | 1999-09-28 |
| 5956279 | Static random access memory device with burn-in test circuit | Hyun-Sun Mo | 1999-09-21 |