Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7971117 | Test circuits of semiconductor memory device for multi-chip testing and method for testing multi chips | Young Dae Lee, Chang Sik Kim, Soo Hwan Kim | 2011-06-28 |
| 7340560 | Methods and devices for accessing a memory using multiple separate address mapped temporary storage areas | Cheol-Shin Kwak, Chul-Sung Park | 2008-03-04 |
| 7068058 | Semiconductor integrated circuit device with test element group circuit | Chul-Sung Park, Yong-Hwan Noh, Hyang-Ja Yang | 2006-06-27 |
| 6822330 | Semiconductor integrated circuit device with test element group circuit | Chul-Sung Park, Yong-Hwan Noh, Hyang-Ja Yang | 2004-11-23 |
| 6714038 | Apparatus for controlling input termination of semiconductor memory device and method for the same | Kwang-Jin Lee | 2004-03-30 |