Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11942379 | Inspection method for detecting a defective bonding interface in a sample substrate, and measurement system implementing the method | Jean-François Boulanger | 2024-03-26 |
| 8312772 | Characterization with picosecond ultrasonics of metal portions of samples potentially subject to erosion | Guray Tas, Sean P. Leary, Jana Clerico, Priya Mukundhan, Zhongning Dai | 2012-11-20 |