Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360151 | Method of testing, wafer, and testing station | Mohamad Dernaika, Alison Perrott, Hua Yang, Frank Peters | 2025-07-15 |
| 11953728 | Method for III-v/silicon hybrid integration | Guomin Yu, Mohamad Dernaika, Hua Yang, Aaron John Zilkie | 2024-04-09 |
| 11378762 | Method for III-V/silicon hybrid integration | Guomin Yu, Mohamad Dernaika, Hua Yang, Aaron John Zilkie | 2022-07-05 |