AP

Alison Perrott

RL Rockley Photonics Limited: 1 patents #61 of 95Top 65%
Overall (All Time): #2,435,973 of 4,157,543Top 60%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12360151 Method of testing, wafer, and testing station Mohamad Dernaika, Ludovic Caro, Hua Yang, Frank Peters 2025-07-15