YT

Yun Tian

QC Qingdao Haier Washing Machine Co.: 21 patents #5 of 190Top 3%
IM Inotera Memories: 12 patents #3 of 129Top 3%
HG Haier Group: 6 patents #6 of 223Top 3%
HC Haier Smart Home Co.: 3 patents #93 of 373Top 25%
MC Midea Group Co.: 2 patents #230 of 926Top 25%
IU Iowa State University: 2 patents #368 of 1,643Top 25%
Ericsson: 1 patents #5,184 of 9,909Top 55%
CC Chongqing Haier Washing Machine Co.: 1 patents #3 of 26Top 15%
CC Chongqing Haier Drum Washing Machine Co.: 1 patents #10 of 22Top 50%
📍 Qingdao, IA: #1 of 3 inventorsTop 35%
Overall (All Time): #75,450 of 4,157,543Top 2%
41
Patents All Time

Issued Patents All Time

Showing 26–41 of 41 patents

Patent #TitleCo-InventorsDate
D739103 Pulsator for washing machine Lin Yang, Zun Liu, Kai Zhang, Meng Hu Gong 2015-09-15
8756028 Fault detection method of semiconductor manufacturing processes and system architecture thereof YIJ CHIEH CHU 2014-06-17
8649990 Method for detecting variance in semiconductor processes YIJ CHIEH CHU, Chun-Chi Chen 2014-02-11
8510610 Method and system of compressing raw fabrication data for fault determination YIJ CHIEH CHU 2013-08-13
D679462 Washing machine Tao Zhang, Feng Li, Meng Hu Gong, Chun Xia Zhou, Wen Ting Xu 2013-04-02
8332416 Specification establishing method for controlling semiconductor process Cheng-Hao Chen, Shih Chang Kao, YIJ CHIEH CHU, Wei-Jun Chen 2012-12-11
8265903 Method for assessing data worth for analyzing yield rate YIJ CHIEH CHU, Chun-Chi Chen, Shih Chang Kao, Cheng-Hao Chen 2012-09-11
8244500 Method of adjusting wafer processing sequence Chun-Chi Chen, YI FENG LEE, Wei-Jun Chen, Shih Chang Kao, YIJ CHIEH CHU +1 more 2012-08-14
8195431 Method for evaluating efficacy of prevention maintenance for a tool YI FENG LEE, Chun-Chi Chen, Shih Chang Kao, Wei-Jun Chen 2012-06-05
8170964 Method for planning a semiconductor manufacturing process based on users' demands using a fuzzy system and a genetic algorithm model Wei-Jun Chen, Chun-Chi Chen, YI FENG LEE, Tsung-Wei Lin 2012-05-01
8090668 Method for predicting cycle time YI FENG LEE, Chun-Chi Chen, Tsung-Wei Lin 2012-01-03
8032248 Method for finding the correlation between the tool PM and the product yield YI FENG LEE, Chun-Chi Chen, Wei-Jun Chen, Tsung-Wei Lin 2011-10-04
8010212 Fuzzy control method for adjusting a semiconductor machine YI FENG LEE, Tzu-Cheng Lin, Chun-Chi Chen 2011-08-30
7855086 Method for monitoring fabrication parameter YI FENG LEE, Chun-Chi Chen, Wei-Jun Chen 2010-12-21
7375343 A1MgB14 and related icosahedral boride semiconducting materials for neutron sensing applications Bruce A. Cook, John E. Snyder, Alan P. Constant 2008-05-20
7238429 Ultra-hard low friction coating based on A1MgB14 for reduced wear of MEMS and other tribological components and system Bruce A. Cook, Joel Harringa, Alan P. Constant, Alan Russell, Palaniappa Molian 2007-07-03