Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8756028 | Fault detection method of semiconductor manufacturing processes and system architecture thereof | Yun Tian | 2014-06-17 |
| 8649990 | Method for detecting variance in semiconductor processes | Chun-Chi Chen, Yun Tian | 2014-02-11 |
| 8510610 | Method and system of compressing raw fabrication data for fault determination | Yun Tian | 2013-08-13 |
| 8332416 | Specification establishing method for controlling semiconductor process | Cheng-Hao Chen, Yun Tian, Shih Chang Kao, Wei-Jun Chen | 2012-12-11 |
| 8265903 | Method for assessing data worth for analyzing yield rate | Chun-Chi Chen, Yun Tian, Shih Chang Kao, Cheng-Hao Chen | 2012-09-11 |
| 8244500 | Method of adjusting wafer processing sequence | Yun Tian, Chun-Chi Chen, YI FENG LEE, Wei-Jun Chen, Shih Chang Kao +1 more | 2012-08-14 |