Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8332416 | Specification establishing method for controlling semiconductor process | Cheng-Hao Chen, Yun Tian, YIJ CHIEH CHU, Wei-Jun Chen | 2012-12-11 |
| 8265903 | Method for assessing data worth for analyzing yield rate | YIJ CHIEH CHU, Chun-Chi Chen, Yun Tian, Cheng-Hao Chen | 2012-09-11 |
| 8244500 | Method of adjusting wafer processing sequence | Yun Tian, Chun-Chi Chen, YI FENG LEE, Wei-Jun Chen, YIJ CHIEH CHU +1 more | 2012-08-14 |
| 8195431 | Method for evaluating efficacy of prevention maintenance for a tool | YI FENG LEE, Chun-Chi Chen, Yun Tian, Wei-Jun Chen | 2012-06-05 |