Kenneth Steeples — 6 Patents at Qc Solutions

Kenneth Steeples has been granted 6 US patents while listed as an inventor at Qc Solutions. The first was granted in 1981 and the most recent in July 2008. Kenneth Steeples ranks #779,687 of 4,157,543 US inventors in our database (top 18.8%). Patent records list Kenneth Steeples in Edinburgh, MA, GB.

Patents per Year

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #	Title	Co-Inventors	Date
7403023	Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leaving the vacancy defects substantially unaltered.	Edward Tsidilkovski	2008-07-22
7160742	Methods for integrated implant monitoring	—	2007-01-09
7119569	Real-time in-line testing of semiconductor wafers	—	2006-10-10
6911350	Real-time in-line testing of semiconductor wafers	Edward Tsidilkovski	2005-06-28
4394180	Method of forming high resistivity regions in GaAs by deuteron implantation	Geoffrey Dearnaley, Ian J. Saunders	1983-07-19
4290825	Semiconductor devices containing protons and deuterons implanted regions	Geoffrey Dearnaley, Ian J. Saunders	1981-09-22

Kenneth Steeples — 6 Patents

Patents per Year

Issued Patents All Time

Patent Widget