Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7403023 | Apparatus and method of measuring defects in an ion implanted wafer by heating the wafer to a treatment temperature and time to substantially stabilize interstitial defect migration while leaving the vacancy defects substantially unaltered. | Kenneth Steeples | 2008-07-22 |
| 6911350 | Real-time in-line testing of semiconductor wafers | Kenneth Steeples | 2005-06-28 |