Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for test time reduction using fractional data packing

Method and apparatus for test time reduction using fractional data packing

US Patent 9970987 · Granted May 15, 2018

Estimated economic value: $29,849,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Secured scan access for a device including a scan chain2025
Secured scan access for a device including a scan chain2024
Generating multiple pseudo static control signals using on-chip JTAG state machi2024
Generating multiple pseudo static control signals using on-chip JTAG state machi2024
Full pad coverage boundary scan2023
Scan test control decoder with storage elements for use within integrated circui2023
X-ray mass flow rate sensors for high pressure processes2023
Memory optimized GNSS correlator2023
Generating multiple pseudo static control signals using on-chip JTAG state machi2022
Generating multiple pseudo static control signals using on-chip JTAG state machi2022
Scan test control decoder with storage elements for use within integrated circui2022
Non-linearity correction2022