Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › General universal device interface for automatic test equipment for semiconductor testing

General universal device interface for automatic test equipment for semiconductor testing

US Patent 9921266 · Granted Mar 20, 2018

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Plating methods for modular and/or ganged waveguides for automatic test equipmen2021
Automated power-in-the-bucket measurement apparatus for large aperture laser sys2019
Wave interface assembly for automatic test equipment for semiconductor testing2019
Multiple waveguide structure with single flange for automatic test equipment for2019
Method and apparatus for socket power calibration with flexible printed circuit 2019
Integrated waveguide structure and socket structure for millimeter waveband test2018
Production-level modularized load board produced using a general universal devic2018
Handler with integrated receiver and signal path interface to tester2017
System and method for providing high RF signal isolation and low common ground i2006