Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Systems and methods for automatic test pattern generation for integrated circuit technologies

Systems and methods for automatic test pattern generation for integrated circuit technologies

US Patent 9726722 · Granted Aug 8, 2017

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Integrated circuit package receiving test pattern and corresponding signature pa2018
Method and apparatus for warming up integrated circuits2015
Method and apparatus for testing2014
Buffer management architecture2014
Method and system for iteratively testing and repairing an array of memory cells2013
Method and apparatus for warming up integrated circuits2013
Method and apparatus for memory test2013
Memory repair system and method2013
Method and apparatus for memory test2012
Buffer management architecture2012
System and method for soft error scrubbing2012
Integrated circuit testing using segmented scan chains2011