Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for iteratively testing and repairing an array of memory cells

Method and system for iteratively testing and repairing an array of memory cells

US Patent 8615688 · Granted Dec 24, 2013

Estimated economic value: $3,909,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automated testing of utility infrastructure assets2021
Data processing circuits2020
Integrated circuit package receiving test pattern and corresponding signature pa2018
Systems and methods for automatic test pattern generation for integrated circuit2017
Method and apparatus for warming up integrated circuits2015
Method and apparatus for testing2014
Buffer management architecture2014
Method and apparatus for warming up integrated circuits2013
Method and apparatus for memory test2013
Memory repair system and method2013
Memory repair system and method2013
Memory repair system and method2013