Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Pattern data generation method, pattern verification method, and optical image calculation method

Pattern data generation method, pattern verification method, and optical image calculation method

US Patent 9576100 · Granted Feb 21, 2017

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Manufacturing method of a semiconductor device and method for creating a layout 2025
Mask design method and storage medium thereof2025
Mask design method and storage medium thereof2025
Semiconductor device, semiconductor memory device, and manufacturing method of s2024
Manufacturing method of a semiconductor device and method for creating a layout 2024
Method for displaying index values in generation of mask pattern verification mo2022
Manufacturing method of a semiconductor device and method for creating a layout 2022
Method of displaying model and designing pattern, and storage medium2022
Pattern generation device, pattern generation method, and method of manufacturin2022
Pattern generation device, pattern generation method, and method of manufacturin2022
Mask pattern correction system, and semiconductor device manufacturing method ut2020
Manufacturing method of a semiconductor device and method for creating a layout 2020