Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Automated test platform utilizing segmented data sequencers to provide time controlled test sequences to device under test

Automated test platform utilizing segmented data sequencers to provide time controlled test sequences to device under test

US Patent 9459978 · Granted Oct 4, 2016

Estimated economic value: $2,502,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Scalable test platform in a PCI express environment with direct memory access2016
Scalable test platform in a PCI express environment with direct memory access2016
Scalable test platform in a PCI express environment with direct memory access2016
Scalable test platform in a PCI express environment with direct memory access2016
Scalable test platform in a PCI express environment with direct memory access2016
Scalable test platform in a PCI express environment with direct memory access2016
Scalable test platform2016
Scalable test platform2016
Scalable test platform2016
Automated test platform utilizing status register polling with temporal ID2015
Automated test platform utilizing status register polling with temporal ID2015
Automated test platform utilizing status register polling with temporal ID2015