Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method, apparatus and system for measuring latency in a physical unit of a circuit

Method, apparatus and system for measuring latency in a physical unit of a circuit

US Patent 9262347 · Granted Feb 16, 2016

Estimated economic value: $10,295,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automated recognition of a device under test2025
Offloading compute processing to an input/output (I/O) device connected over a U2025
Multiplexer-enabled cables and test fixtures2025
System, method, apparatus and architecture for dynamically configuring device fa2025
System, apparatus and method for handling multi-protocol traffic in data link la2025
Secure stream protocol for serial interconnect2025
Power-conscious input/output (I/O) buffer allocation2025
Interconnect network for multi-tile system on chips2025
Extending multichip package link off package2025
Systems and methods for sharing memory across clusters of directly connected nod2025
Stream routing and ide enhancements for PCIe2025
Non-posted write transactions for a computer bus2025