Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Electron microscope sample holder and sample observation method

Electron microscope sample holder and sample observation method

US Patent 9159530 · Granted Oct 13, 2015

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Charged particle beam apparatus and cleaning method2022
Holder and charged particle beam apparatus2021
Charged particle beam apparatus and control method thereof2020
Holder and charged particle beam apparatus2020
Anti-contamination trap, and vacuum application device2019
Charged particle beam device and charged particle beam device control method2018
Scanning electron microscope2014
Scanning electron microscope2014
Sample holder for an electron microscope2013
Sample holder for an electron microscope2013
Electron microscopy2011