Internal material condition monitoring for control

Assignee

• Jentek Sensors

Inventors

• Neil J. Goldfine (89 patents)
• Vladimir A. Zilberstein (24 patents)
• Ian Shay (16 patents)
• Christopher A. Craven (11 patents)
• David C. Grundy (26 patents)
• Volker Weiss (23 patents)
• Andrew P. Washabaugh (50 patents)

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