VZ

Vladimir A. Zilberstein

JS Jentek Sensors: 23 patents #6 of 43Top 15%
MO Modar: 1 patents #5 of 8Top 65%
📍 Brookline, MA: #153 of 3,196 inventorsTop 5%
🗺 Massachusetts: #4,370 of 88,656 inventorsTop 5%
Overall (All Time): #174,471 of 4,157,543Top 5%
24
Patents All Time

Issued Patents All Time

Showing 1–24 of 24 patents

Patent #TitleCo-InventorsDate
8981018 Internal material condition monitoring for control Neil J. Goldfine, Ian Shay, Christopher A. Craven, David C. Grundy, Volker Weiss +1 more 2015-03-17
8768657 Remaining life prediction for individual components from sparse data Neil J. Goldfine, Volker Weiss, Yanko K. Sheiretov 2014-07-01
8494810 Component adaptive life management Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, David C. Grundy, Robert Joseph Lyons +2 more 2013-07-23
8237433 Magnetic field characterization of stresses and properties in materials Neil J. Goldfine, Ian Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy +1 more 2012-08-07
7876094 Magnetic field characterization of stresses and properties in materials Neil J. Goldfine, Ian Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy +2 more 2011-01-25
7696748 Absolute property measurements using electromagnetic sensors Darrell E. Schlicker, Neil J. Goldfine, David C. Grundy, Robert Joseph Lyons, Andrew P. Washabaugh +3 more 2010-04-13
7533575 Quasistatic magnetic and electric field stress/strain gages Neil J. Goldfine, Darrell E. Schlicker, David C. Grundy, Yanko K. Sheiretov, Leandro M. Lorilla +3 more 2009-05-19
7526964 Applied and residual stress measurements using magnetic field sensors Neil J. Goldfine, James Fisher, David C. Grundy, Darrell E. Schlicker, Vladimir Tsukernik +3 more 2009-05-05
7518360 Hybrid wound/etched winding constructs for scanning and monitoring Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Ian C. Shav, Mark Windoloski +3 more 2009-04-14
7451657 Material condition monitoring with multiple sensing modes Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Volker Weiss, Christopher A. Craven +4 more 2008-11-18
7348771 Method for verifying sensor condition Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh, Vladimir Tsukemik 2008-03-25
7280940 Segmented field dielectric sensor array for material characterization Neil J. Goldfine, Darrell E. Schlicker, Yanko K. Sheiretov, Andrew P. Washabaugh, David C. Grundy 2007-10-09
7230421 Damage standard fabrication with attached sensor Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Volker Weiss, Andrew P. Washabaugh 2007-06-12
7188532 Self-monitoring metals, alloys and materials Neil J. Goldfine, David C. Grundy, Andrew P. Washabaugh, Darrell E. Schlicker, Ian Shay +5 more 2007-03-13
7161351 Hidden feature characterization using a database of sensor responses Neil J. Goldfine, Darrell E. Schlicker, David C. Grundy, Ian Shay, Robert Joseph Lyons +1 more 2007-01-09
7161350 Method for material property monitoring with perforated, surface mounted sensors Neil J. Goldfine, Darrell E. Schlicker, David C. Clark, Karen E. Walrath, Volker Weiss +3 more 2007-01-09
7106055 Fabrication of samples having predetermined material conditions Neil J. Goldfine, David C. Grundy, Volker Weiss, Andrew P. Washabaugh 2006-09-12
7095224 Process control and damage monitoring Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy 2006-08-22
6995557 High resolution inductive sensor arrays for material and defect characterization of welds Neil J. Goldfine, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh 2006-02-07
6952095 Surface mounted and scanning spatially periodic eddy-current sensor arrays Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh, Vladimir Tsukernik 2005-10-04
6798198 Fluid supports for sensors Vladimir Tsukernik, Neil J. Goldfine, Andrew P. Washabaugh, Darrell E. Schlicker, Karen E. Walrath +1 more 2004-09-28
6727691 High resolution inductive sensor arrays for material and defect characterization of welds Neil J. Goldfine, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh 2004-04-27
6657429 Material condition assessment with spatially periodic field sensors Neil J. Goldfine, Darrell E. Schlicker, Andrew P. Washabaugh 2003-12-02
5527471 Iridium material for hydrothermal oxidation environments Glenn T. Hong 1996-06-18