Method and apparatus for measurement of material condition

Assignee

• Jentek Sensors

Inventors

• Scott Denenberg (53 patents)
• Yanko K. Sheiretov (28 patents)
• Neil J. Goldfine (89 patents)
• Todd M Dunford (23 patents)
• Andrew P. Washabaugh (50 patents)
• Don Straney (3 patents)
• Brian L Manning (1 patents)

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